Resistivity- meter

The mobile hand-held measuring device Loresta AX is used for measuring conductors and semiconductors in the lower resistance range. Measuring range: 10-2 - 106 Ω.

It is suitable for simple process or quality control.

To determine the specific resistances, a fixed correction factor (RCF) is used. The fixed RCF allows a sufficiently accurate calculation for quality control.

The measuring device works according to the 4-point measuring method. The method is based on the four-wire method and was developed to eliminate the influence of contact resistance.

The Loresta series offers a choice of 4-pin probes for a variety of applications, such as very small samples or thin films. The measuring heads consist of four needle-like electrodes.

To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other. The electrodes are usually arranged collinearly, but other arrangements, such as the square, are possible.

The two outer electrodes carry an impressed direct current, when the two inner electrodes pick up the voltage on the surface of the sample. Thus, the electrical resistance can be determined.

Up to 1000 measurement results are automatically stored and can be transfered via USB stick.

The Resistivity Measuring Systems of Nittoseiko  Analytech have been designed to ensure easy RCF calculation and thus resistivity is measured in a simple test procedure.

With the devices Hiresta-UX, Loresta-GX and Loresta-AX an accurate measurement of surface resistivity and volume resistivity is possible.

For over 40 years, the measuring instruments have been convincing due to their first-class quality, easy handling and precise measurement results.

Hiresta - UX

Loresta - GX

Loresta - AX

Loresta - AX

The Loresta GX is used to measure conductors and semiconductors in the lower resistance range.

Measuring range: 10-4 - 107 Ω x cm.

It is used to measure the surface resistivity (Ω / cm)or  the volume resistivity (Ω · cm)

electrical conductivity (S / cm) in the low-resistance range.

The Loresta-GX works according to the 4-pin measuring method.

The method is based on the four-wire method and was developed to eliminate the influence of contact resistance. The measuring heads consist of four needle-like electrodes. To simplify the measurement method and calculate the correction factors, all four electrodes are at an equidistant distance from each other.

The electrodes are usually arranged collinear, so the two outer electrodes carry an impressed direct current while  the two inner electrodes pick up the voltage on the surface of the sample and  the electrical resistance can be determined precisely.

The resistivities are obtained by applying the correction factor and including the thickness of the sample.

The Loresta GX has a mode that allows measurements of silicon wafers.

A color 7.5 "TFT LCD touch display facilitates reading and menu navigation. In addition, the data can be transferred via USB interface. The automatic  auto-hold mode and timer mode enable convenient one-touch operation.

The applied voltage can be choosen selectively, so that also measurements of materials with a very low conductivity are possible.

Loresta - GX

The Resistivity Correction Factor (RCF) is changed with the sample shapes and sizes as well as measuring positions, using the  4-pin probe method, since the sample size or measuring position are not fixed, the electric energy distributed in the sample is changed with the sample size and the measuring positions.

 If the sample size is small or the measuring position is near the sample edge, the peak of the electric field becomes higher to yield a high resistance. This is caused by the electric energy being contained in the sample.

The correction factors RCF (S) and RCF (V) of the ring electrode probe are determined by the electrode diameters. Correction factors of probes is registered previously in Hiresta-UX. Therefore the value can be easily called back  automatically by selecting a probe type.

 The Resistivity Correction Factor is used to obtain correct values for the volume or surface resistivity by forecasting such difference in the peak of the electric energy. The electric potential Φ(r) in an optional point in a sample and is calculated by solving a Poisson’s equation  under a specific condition.

Poisson‘s Equation: ∇2 Φ(r) = 2 ρv I [ δ (r-rD) – δ(r-rA)]

The Loresta-GX has a built-in software for calculating this factor and is able to derive the factor by simple input of the sample shapes (rectangular or disk) and size as well as the measuring position. The Loresta-AX uses a fixed RCF which allows a sufficient precise measuring.

The 4-pin probe method was included to the JIS K7194 (Japanese Industrial Standard) in 1994.

Resistivity measurment , what’s about ?

The Hiresta - UX measuring device is used to measure semiconductors or non - conductors (insulators).

Measuring range of 103 - 1014 Ω x cm. The Hiresta UX is specialised in measuring the resistance, the surface and volume resistivity of various substances and materials of all shapes and sizes in the high-resistance measuring range.

It works with measuring heads, which are equipped with concentric ring electrodes and uses correction factors to determine the specific resistances. However, these are exclusively dependent on the geometry of the measuring head electrodes, so that a correction of the measuring position is not required. The Hiresta-UX has a built-in switch box that allows quick switching of the measurements from ρs to ρv.

In conjunction with the optional insulating UFL Table (RMJ 354), the specific resistance [Ω ∙ cm] can also be measured exactly.

29 steps of applied voltage with Auto Sweep Function enables measuring voltage dependence of resistance value .Up to 2000 measurement results can be exported to USB memory stick

The conductivity meter impresses with its compact design, a color 7.5 "TFT touch display and user-friendly menu navigation.

Hiresta - UX

The multimeter, equipped with 2 terminals, is a cheap and simple instrument for measuring voltage, current and resistance. However, the conventional 2-terminal method is not suitable for material evaluation. The 4-terminal probe of the MCCAT Measuring Systems eliminates lead-wire connector and contact resistance. More precise measuring of resistance is achieved.

In the case of the 4-pin probe method, 4 needle-type electrodes are placed linearly on a sample, a certain current flows between 2 external pin probes (1 and 4), and a potential difference formed between 2 inner pin probes (2 and 3) is measured to determine the resistance.

Then, multiplying the measured resistance (R in the unit of Q) with the sample thickness (t) and the Resistivity Correction Factor (RCF) derives the volume resistivity. In this way, the 4-pin probe method and 4-terminal method have a common measurement system, but the electrode sections in contact with the sample is different. Only the placement of a probe on a sample is required for measurement in this 4-pin probe method, but electrode formation over the sample is not required unlike the 4-terminal method and thus the procedure is remarkably more efficient.

The Powder Measuring System MCP-PD51 contains a high precision pressure gauge for the measurement of conductive powders for maximum pressure of 20kN and is quickly attached to either the Loresta-GX or Hiresta-UX unit.

Key features:

• Easy sample change and cleaning
• 4-pin probe for precise measurement of low range resistivity
• Ring probe for high range resistivity
• Powder is pressed in a cylindrical shape for measuring

Application:

Powder materials of carbon products:

Materials used for rechargeable battery electrodes, Li-Ion technology battery, condensers and resistance material and insulating electronics / cokes / graphite / carbon black / carbon fiber /nano carbon, etc.

Metal powder:

Materials used for battery electrodes, thin film materials

such as copper powder or ITO powder, for circuit board

materials,  conductive paste and electro conductive paint.

Others:

Printer toner, magnetic material such as ferrite, food, nano fibers, surface coating… and thousand other application.

Powder Measuring System MCP-PD51

Powder Measuring System MCP-PD51